专利名称：Software defect prediction发明人：Billy Edward Hunt, Jr.,Jennifer J.
Kirkpatrick,Richard Allan Kloss,WilliamJoseph Schmitt
申请号：US13436487申请日：20120330公开号：US08881095B1公开日：20141104
专利附图：
摘要：A method of software defect prediction by a computer is provided. The methodcomprises identifying software test organizations scheduled to perform testing on an
application or applications, where the scope of the software testing varies betweendifferent test organizations, identifying the type of test cases to be executed by eachtest organization, where the test types comprise at least one of new functionality testand regression test, and identifying a planned number of test cases to be executed foreach test type. A forecast number of defects are modeled by a computer based on theplanned number of test cases to be executed and a defect rate for each test type. Thedevelopment staffing level capable of fixing forecast defects by the scheduled
completion of testing is calculated by the computer based on a fix capacity of a softwaredevelopment organization. Development resources are assigned to fix defects based onthe calculated development staffing level.
申请人：Billy Edward Hunt, Jr.,Jennifer J. Kirkpatrick,Richard Allan Kloss,William JosephSchmitt
地址：Overland Park KS US,Olathe KS US,Fort Myers FL US,Bonner Springs KS US
国籍：US,US,US,US
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