专利名称：Method for evaluating a test program
quality
发明人：Joerg Grosse,Mark Hampton申请号：US11658930申请日：20050728公开号：US08311793B2公开日：20121113
专利附图：
摘要：The disclosure relates to a method for rating the quality of a test program forintegrated circuits simulated by means of a computer. The method includes provision of afirst file which describes an integrated circuit; simulation of a mutated integrated circuit
which is obtained by incorporating mutations into the integrated circuit described in thefirst file; supplying input values to the mutated integrated circuit and recording of theoutput values produced for these input values by the mutated integrated circuit;comparison of the output values produced by the mutated integrated circuit withexpected values which are provided by the test program, where the expected values havebeen generated in a reference system; and rating of the quality of the test program onthe basis of the comparison results.
申请人：Joerg Grosse,Mark Hampton
地址：Schliersee-Neuhaus DE,La Cote St. Andre FR
国籍：DE,FR
代理机构：McDermott Will & Emery LLP
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