DELAY CIRCUIT AND RELATED METHOD

专利名称：DELAY CIRCUIT AND RELATED METHOD发明人：Chang-Po Ma,Yuan-Chin Liu申请号：US12110368申请日：20080428

公开号：US20090278549A1公开日：20091112

专利附图：

摘要：A delay circuit includes a first delay module, a delay measurement unit and afault judge unit. The first delay module has a first delay circuit with at least one delaystage. The delay measurement unit is used for measuring a first delay amount and asecond delay amount of the first delay chain respectively corresponding to a first

number and a second number of delay stages. The fault judge unit is used fordetermining if the first delay chain has delay faults or not according to the first andsecond delay amounts.

申请人：Chang-Po Ma,Yuan-Chin Liu

地址：Hsinchu City TW,Hsinchu City TW

国籍：TW,TW

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