专利名称：Inspection equipment发明人：野口 正樹,永田 孝弘,大和 健申请号：JP2019055503申请日：20190322公开号：JP2020153947A公开日：20200924
专利附图：
摘要：PROBLEM TO BE SOLVED: To accurately inspect a bandpass characteristic of anelectronic component. One end of a first signal line pattern 210 is electrically connectedto a first connector 212. One end of the second signal line pattern 220 is electricallyconnected to the second connector 222. The other end of the second signal line pattern
220 faces the other end of the first signal line pattern 210. The conductive block 100 hasa convex portion 106. The convex portion 106 of the conductive block 100 is locatedbetween the other end of the first signal line pattern 210 of the wiring board 200 and theother end of the second signal line pattern 220 of the conductive pattern 230. It iselectrically connected to the part. [Selection diagram] Fig. 2
申请人：株式会社ヨコオ
地址：東京都北区滝野川７丁目５番１１号
国籍：JP
代理人：速水 進治,天城 聡
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