专利名称：MEASURING DEVICE AND A MEASURING
METHOD WITH HISTOGRAM FORMATION
发明人：Andrew Schaefer申请号：US13469440申请日：20120511
公开号：US20120287738A1公开日：20121115
摘要：A measuring device for the storage of test values and associated addressesprovides a first storage region () and a second storage region (). The first storage region() comprises a first number of memory cells () of a first cell size (). The second storageregion () comprises a second number of memory cells () of a second cell size (). Themeasuring device further provides a third storage region () made from a second numberof memory cells (). A memory cell () of the third storage region () is rigidly assigned toeach memory cell () of the second storage region ().
申请人：Andrew Schaefer
地址：Munich DE
国籍：DE
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