Method and apparatus for improving fault test cove

专利名称：Method and apparatus for improving fault

test coverage for an integrated circuit

发明人：Mark Wong,Philip Hurlow申请号：US09405521申请日：19990923公开号：US06532557B1公开日：20030311

专利附图：

摘要：An integrated circuit is disclosed that includes an output pad, a first functionalunit block (FUB) coupled to the output pad and a control circuit coupled to the first FUB.According to one embodiment, the control circuit is adaptable to select a first group or a

second group of internal signals within the first FUB that are to be transmitted to theoutput pad upon initiating a test mode at the integrated circuit. According to a furtherembodiment, the control circuit is further adaptable to receive a test vector includingdata that determines whether the first or second group of internal signals aretransmitted to the output pad. According to yet another embodiment, the integratedcircuit includes a second FUB coupled to the output pad and the control circuit. Thecontrol circuit is adaptable to select between a third group of internal signals and afourth group of internal signals within the second FUB that are to be transmitted to theoutput pad.

申请人：SILICON MOTION, INC.

代理机构：Blakely, Sokoloff, Taylor & Zafman LLP

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