专利名称：INDEX OF REFRACTION SENSOR SYSTEM
WITH DUAL MODE TEMPERATURECONTROL
发明人：BALCHUNAS, John Anthony申请号：EP16801624.4申请日：20161024公开号：EP3368883B1公开日：20191127
摘要：A sensor system (100) utilizes temperature control systems (262) and methodsto achieve and maintain a sample in a sample chamber (110) at a sampling temperature.Such sensor systems and methods may employ a dual mode temperature controllerincluding a spike mode (SMC) controller (274) and a proportional-integral-derivative (PID)mode controller (272). Based on a temperature of the sample, the temperaturecontroller of the sensor system can initially enter the spike mode or the PID mode.
代理机构：Greaves Brewster LLP
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