OPTICAL MEASUREMENT APPARATUS AND METHOD THEREFOR

专利名称：OPTICAL MEASUREMENT APPARATUS AND

METHOD THEREFOR

发明人：HOLLEY, Richard,TAYLOR, Robin申请号：EP08788611.5申请日：20080729公开号：EP2185064B1公开日：20170517

摘要：An optical measurement apparatus comprises an optical system (100) having areceiving axis (115). The optical system (100) comprises a source (102) that generates aprobe beam that is directed to a location to be measured (114). A detector (112) of theoptical system receives a reflected beam from the location to be measured (114). Theapparatus also comprises a processing resource that receives an output signal from thedetector (112) and makes an assessment of a characteristic of the output signal in orderto determine a degree of alignment of the location to be measured (114) with thereceiving axis (115) of the optical system (100).

申请人：LEIN APPLIED DIAGNOSTICS LTD

地址：GB

国籍：GB

代理机构：Kay, Ross Marcel

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