Electronic circuit for single-event latch-up detec

专利名称：Electronic circuit for single-event latch-up

detection and protection

发明人：Joseph Sylvester Chang,Wei Shu,Jize Jiang申请号：US15518762申请日：20151117公开号：US10566780B2公开日：20200218

专利附图：

摘要：An electronic circuit for single-event latch-up (SEL) detection and protection ofa target integrated circuit (IC) is disclosed. The circuit comprises: a first detectorconfigured for detecting an absolute load current (i) and comparing the absolute load

current (i) with a threshold current (i); a second detector configured for detecting a rateof change of load current (di/dt) and comparing the rate of change of load current (di/dt)with a threshold current change rate (di/dt); and a determination module for triggering apower shut-down to the target IC if the absolute load current (i) exceeds the thresholdcurrent (i) and/or the rate of change of load current (di/dt) exceeds the threshold currentchange rate (di/dt).

申请人：NANYANG TECHNOLOGICAL UNIVERSITY

地址：Singapore SG

国籍：SG

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